Scanning Probe Microscopy

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General Information

Image Gallery
A collection STM/AFM images. University of Augsburg - [d, e]

Scanning probe microscopy
General Principles of Scanning probe microscopy - [e]

Scanning probe microscopy in life science
Information about the basic principles and methods of scanning probe microscopy. The focus is on applications in biotechnology and life science - [e]

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Lecture Notes, Tutorials

Atomic Force Microscopes
The tutorial serves as a basic introduction to the design and operation of an atomic force microscope - Format: PDF - [e]

Scanning Electron Microscopy, SEM
Lecture Notes: Techniques in Modern Microscopy - [e]

Scanning Probe Microscopy and Atomic Force Microscopy
Recent updates and an overview of the technology. AZoM, Japan - [e]

Scanning Probe Microscopy, SPM
Lecture notes: Imaging Surfaces on a Fine Scale - [e]

Techniques in Modern Microscopy
Lecture notes - [e]

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Journals

Journal of Scanning Probe Microscopy
... typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. American Scientific Publishers, USA - [e]

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Dissertations

Atomic force microscope nanography on semiconductor heterostructures
Dissertation, 2000. ETH Zürich, Switzerland - [e]

Atomic force microscopy of organic nonlinear optical molecules at the gas-liquid and gas-solid interface
Dissertation, 1999. ETH Zürich - [e]

Charge writing with an atomic force microscope tip and electrostatic attachment of colloidal particles to the charge patterns
Dissertation, 2002. ETH Zürich - [e]

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Research facilities and departments

NanoScience & Scanning Probe Microscopy Group
The research program is to apply the recently developed tools, techniques and materials to the emerging field of Nanoelectronics. McGill University, Canada - [e]

Scanning Probe Methods Group
The research activities are concentrated on nanometer-scale science and technology based on scanning probe methods (SPM). University of Hamburg - [e]

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Organisations

AFM on Mars Project
Homepage of the Swiss Consortium for design and development of the Atomic Force Microscope (AFM) for the Mars SURVEYOR 2001 mission - [e]

Russian Society of Scanning Probe Microscopy and Nanotechnology
... is a profitless public organisation working according to the Russian legislation - [e]

Other notes:

Related Books and Scientific Literature: Scanning Probe Microscopy:

David G. Rickerby, Giovanni Valdrè, Ugo Valdrè, Giovanni Valdre, Ugo Valdre

Impact of Electron and Scanning Probe Microscopy on Materials

This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described.

A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.

Springer; 2008