[Sitemap] [Contact] [Imprint] Deutsche Version Search site 

Scanning Probe Microscopes

Scanning Probe Microscopes

Scanning probe microscopes are used as imaging and analysis devices of surfaces.

Producer and supplier of scanning probe microscopes and SPM accessories.

Further information categories about related topics are listed in the navigation menu on the left side of these page.

[INT] [DE] [USA] [UK] [CH] [JP] [Asia]


International manufacturer and supplier

... a leading supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes - [e]

Nanotechnology, SPM, AFM - [e]

[INT] [DE] [USA] [UK] [CH] [JP] [Asia]



Anfatec Instruments AG
Measurement Science and Technology & Scanning Probe Microscopy - [e]

DME Nanotechnologie GmbH
... ist ein Unternehmen, dass sich im Wesentlichen mit der Entwicklung und Herstellung von Rastersondenmikroskopen befasst - [d, e]

Fries Research & Technology GmbH
... setzt bei der Entwicklung und Fertigung von Oberflächenmessgeräten überwiegend optische Messtechnik ein - [d]

Jeol Deutschland
Elektronenoptik und Rastersondenmikroskopie - [d]

JPK Instruments AG
... is a developer of a new generation of scanning probe microscopes for soft matter and life sciences - [e]

Triple-O Microscopy GmbH
SNOM; AFM microscopes - [e]

... is a manufacturer of high-resolution optical and scanning probe microscopy solutions for scientific and industrial applications: Scanning Near-field optical Microscopy (SNOM or NSOM); Atomic Force Microscopy (AFM); Confocal Microscopy; Raman Microscopy - [e]

[INT] [DE] [USA] [UK] [CH] [JP] [Asia]


United States of America, USA

Advanced Surface Microscopy
... solves Processing and Materials Problems using Scanning Probe Microscopy since 1990 - [e]

Ambios Technology, Inc.
... supplies industrial and academic researchers with affordable, world-class surface metrology instruments - [e]

Micro Photonics
... is the leading source of advanced instrumentation for scientific and industrial research - [e]

Nanoscience Instruments, Inc.
... is your one source for a variety of AFM systems, probes, accessories, and related nanoscience tools - [e]

Novascan Technologies, Inc.
... offers Atomic Force Microscopes as well as specialized Atomic Force Microscopes that can be integrated with a variety of complimentary instruments such as confocal microscopes, Laser optical traps, and a host of optical microscope setups - [e]

Pacific Nanotechnology, Inc.
Atomic force microscopes (AFM) products that are optimized for research development and process control applications when visualization and measurement of nanometer sized surface structure is critical - [e]

Park Systems
Park Systems’ AFM solutions are derived from our innovations and meet the most rigorous scientific research and nano-manufacturing process control requirements across various fields - [e]

... is an independent analytical testing laboratory specializing in the application of atomic-force microscopy (AFM) to materials research and development - [e]

RHK Technology
... develops and manufactures a complete line of scanning probe microscopes for the performance and customization needs of research scientists around the world - [e]

Veeco Instruments Inc.
... provides the tools to make, measure and visualize today's world-changing technologies - [e]

[INT] [DE] [USA] [UK] [CH] [JP] [Asia]


United Kingdom

Infinitesima Limited
... is a dynamic company that is paving the way to a new era in microscopy - [e]

[INT] [DE] [USA] [UK] [CH] [JP] [Asia]



... heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) - [e]

Nanosurf AG
... research and development of scanning probe microscopes (SPM) and positioning devices with nanometre resolution - [e]

[INT] [DE] [USA] [UK] [CH] [JP] [Asia]



Unisoku Co., Ltd.
Scanning Probe Microscope (SPM) Systems comprising Load-Lock Chamber, Preparation Chamber and Observation Chamber is possible to exchange the probe and the sample while keeping in the Ultra High Vacuum and / or the Low Temperature - [e]

[INT] [DE] [USA] [UK] [CH] [JP] [Asia]



Nanonics Imaging
... is the premier innovator of AFM and NSOM systems in the SPM market - [e]

Other notes:

Information about this site:

The author- or copyrights of the listed Internet pages are held by the respective authors or site operators, who are also responsible for the content of the presentations.
To add your company or product site to this index please use the registration form or send us an eMail.
Scanning Probe Microscopes
Scanning probe microscopes, SPM, AFM, manufacturers, suppliers, products
24.02.2012 00:00:00 [link check]
24.02.2012 [site update]

Chemistry information not found? Try this form:
Custom Search

Related Books and Scientific Literature: Scanning Probe Microscopes:


David G. Rickerby, Giovanni Valdrè, Ugo Valdrè, Giovanni Valdre, Ugo Valdre

Impact of Electron and Scanning Probe Microscopy on Materials

This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described.

A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.

Springer; 2008

Internetchemistry ChemLin © 1996 - 2013 A. J.